Multiple means to the same end: the genetic basis of acquired stress resistance in yeast.
Berry DB; Guan Q; Hose J; Haroon S; Gebbia M; Heisler LE; Nislow C; Giaever G; Gasch AP; Plos Genetics, 2011, vol. 7, issue 11, p e1002353, ISSN 15537404. ISBN 15537404.

Full Text Resources Located for this Citation

View article on EBSCOhost(Login required)
View article via CrossRef