Radiation tolerance of complex oxides
Sickafus KE; Minervini L; Grimes RW; Valdez JA; Ishimaru M; Li F; McClellan KJ; Hartmann T; Science (New York, N.Y.), 2000, vol. 289, issue 5480, p 748, ISSN 10959203. ISBN 10959203.

Full Text Resources Located for this Citation

View article on EBSCOhost(Login required)
View article via CrossRef