An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range.
Vine, D. J.; Williams, G. J.; Clark, J. N.; Putkunz, C. T.; Pfeifer, M. A.; Legnini, D.; Roehrig, C.; Wrobel, E.; Huwald, E.; van Riessen, G.; Abbey, B.; Beetz, T.; Irwin, J.; Feser, M.; Hornberger, B.; McNulty, I.; Nugent, K. A.; Peele, A. G.; Review of Scientific Instruments, 2012, vol. 83, issue 3, p 033703, ISSN 00346748. ISBN 00346748.

Full Text Resources Located for this Citation

View article on EBSCOhost(Login required)
View article via CrossRef