Large scan area high-speed atomic force microscopy using a resonant scanner.
Zhao, B.; Howard-Knight, J. P.; Humphris, A. D. L.; Kailas, L.; Ratcliffe, E. C.; Foster, S. J.; Hobbs, J. K.; Review of Scientific Instruments, 2009, vol. 80, issue 9, p 093707, ISSN 00346748. ISBN 00346748.

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