Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope.
Chun, Byung Seon; Kim, Kwangsoo; Gweon, Daegab; Review of Scientific Instruments, 2009, vol. 80, issue 7, p 073706, ISSN 00346748. ISBN 00346748.

Full Text Resources Located for this Citation

View article on EBSCOhost(Login required)
View article via CrossRef