We found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleTailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm filmsAuthorsKumar, Manoj; Bagga, Anjana; Neeleshwar, SPublicationNanoscale Research Letters, 2012, Vol 7, Issue 1, p1ISSN1931-7573Publication typearticleDOI10.1186/1556-276X-7-169