We found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleSoft X-ray microscopy at a spatial resolution better than 15 nm.AuthorsChao, Weilun; Harteneck, Bruce D.; Liddle, J. Alexander; Anderson, Erik H.; Attwood, David T.PublicationNature, 2005, Vol 435, Issue 7046, p1210ISSN0028-0836Publication typearticleDOI10.1038/nature03719